Transmission and Scanning Electron Microscopy

EMS Laboratories has been providing electron microscopy services since 1968, and the principal investigator has over 40 years experience in the analysis of materials by TEM.  For materials analysis EMS can provide:

· Electron diffraction of crystalline structures.

· Energy dispersive x-ray analysis for chemical composition.

· Scanning/transmission electron microscopy (STEM) for high resolution scanning analysis.

Applications of TEM:

· Particle Analysis

Asbestos (air, water, soils, sediments, tissues)

Pigment

Aerosols

Catalytic materials

Oxides (magnetic tape)

Ceramics

Airborne particles

· Size, Distribution and Crystalline Forms

· Wear Studies

· Corrosion Characterization

· Morphological Studies

· Thin Film Studies of

Oxides

Epitaxial films

Magnetic materials

Scanning electron microscope (SEM) is used most frequently to image directly specimen surfaces.  The SEM is capable of high resolution and high magnifications with great depth of field.

Energy dispersive X-ray spectroscopy (EDX) combined with the SEM makes a powerful tool using electron beam microanalysis in the elemental analysis of minute volumes.  This method enables the identification of elements of atomic weight greater than fluorine with a high degree of accuracy as well as quantitative elemental analysis.

SEM and EDX studies include:

· Morphology and surface topography

· Metallurgical failure analysis

· Corrosion

· Electroplating processes

· Thin films

· Geological samples

· Particles analysis

 

EMS Laboratories Inc. / 117 West Bellevue Drive / Pasadena CA 91105-2503

Tel. (626) 568-4065 or (800) 675-5777 Fax (626) 796-5282