X-ray Diffraction Facility

X-ray Diffractometers - Philips Norelco

· Identification of crystalline compounds present in virtually any material by reference to a computerized data file containing over 40,000 compounds.

· Identification of asbestos and tremolite in talc.

· Identification of materials having the same chemical formula but different crystal structures and physical properties, for example, different forms of SiO₂, TiO₂, CaCO₃, iron oxides, Al₂O₃, etc.

· Identification of clays, corrosion products, and other materials too fine for microscopic identification.

· Non-destructive analysis of powders, thin films, and certain other materials in amounts as small as one milligram.

· Quantitative analysis of compounds with suitable standards

· Quantitative analysis of silica, vanadium oxide, zinc oxide, etc. in air using membrane filters

· NIOSH methods for workplace exposure monitoring.

EMS Laboratories Inc. / 117 West Bellevue Drive / Pasadena CA 91105-2503

Tel. (626) 568-4065 or (800) 675-5777 Fax (626) 796-5282