Accreditations
|
Transmission
and Scanning Electron Microscopy
EMS
Laboratories has been
providing electron microscopy services since 1968, and the principal
investigator has over 40 years experience in the analysis of materials
by TEM. For materials analysis EMS can provide:
Electron diffraction of
crystalline
structures.
Energy dispersive x-ray
analysis for
chemical composition.
Applications
of TEM:
Particle Analysis
Asbestos
(air, water, soils, sediments, tissues)
Pigment
Aerosols
Catalytic materials
Oxides
(magnetic tape)
Ceramics
Airborne
particles
Size, Distribution and Crystalline Forms
Wear Studies
Corrosion Characterization
Morphological Studies
Thin
Film Studies of Oxides
Epitaxial films
Magnetic
materials
Scanning
electron
microscope (SEM) is used most frequently
to image directly
specimen surfaces. The SEM is capable of high resolution and high
magnifications with great depth of field.
Energy
dispersive X-ray spectroscopy (EDX) combined with the SEM makes a
powerful tool
using electron beam microanalysis in the elemental analysis of minute
volumes. This method enables the identification of elements of
atomic weight greater than fluorine with a high degree of accuracy as
well as quantitative elemental analysis.
SEM and
EDX studies include:
Morphology
and surface topography
Metallurgical
failure analysis
Corrosion
Electroplating
processes
Thin
films
Geological
samples
Particles
analysis
|
